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SCL has initiated
screening of microelectronic devices and Electronic parts (passive,
active, leaded and Chip). The available environmental, mechanical
and
Electrical test facilities cater for screening and testing of devices
as per MIL-STD- 883 (for Class level S & B), MIL-STD-750 and
MIL-STD-202.
The devices with
inherent manufacturing defects are weeded out by subjecting them to
battery of tests to accelerate the failure mechanisms. The screening
of parts is carried out to ensure their suitability for a given
application by appropriate selection of tests, durations
and severity. The screening activities are carried out in Static
Safe areas in controlled temperature and humidity conditions.
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Electrical Testing |
